File:AFMsetup.jpg
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AFMsetup.jpg (721 × 569 pixels, file size: 86 KB, MIME type: image/jpeg)
Summary
Typical atomic force microscope (AFM) setup: The deflection of a microfabricated cantilever with a sharp tip is measured by reflecting a laser beam off the backside of the cantilever while it is scanning over the surface of the sample.
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File history
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 07:50, 3 January 2017 | | 721 × 569 (86 KB) | 127.0.0.1 (talk) | Typical atomic force microscope (AFM) setup: The deflection of a microfabricated cantilever with a sharp tip is measured by reflecting a laser beam off the backside of the cantilever while it is scanning over the surface of the sample. |
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File usage
The following 25 pages link to this file:
- AFM-IR
- Atomic force microscopy
- Ballistic electron emission microscopy
- Conductive atomic force microscopy
- Counter-scanning
- Electrostatic force microscope
- Feature-oriented positioning
- Feature-oriented scanning
- IBM (atoms)
- Magnetic force microscope
- Magnetic resonance force microscopy
- Millipede memory
- Nanotechnology
- Near-field scanning optical microscope
- Non-contact atomic force microscopy
- Photothermal microspectroscopy
- Scanning gate microscopy
- Scanning ion-conductance microscopy
- Scanning probe lithography
- Scanning probe microscopy
- Scanning tunneling microscope
- Scanning voltage microscopy
- Spin polarized scanning tunneling microscopy
- Template:Scanning probe microscopy
- Portal:Nanotechnology/Selected article
